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- /* SPDX-License-Identifier: BSD-2-Clause */
- /*******************************************************************************
- * Copyright 2017-2018, Fraunhofer SIT sponsored by Infineon Technologies AG
- * All rights reserved.
- *******************************************************************************/
- #ifdef HAVE_CONFIG_H
- #include <config.h>
- #endif
- #include <stdlib.h>
- #include "tss2_esys.h"
- #include "esys_iutil.h"
- #define LOGMODULE test
- #include "util/log.h"
- #include "util/aux_util.h"
- /** Test the ESYS function Esys_StirRandom.
- *
- * Tested ESYS commands:
- * - Esys_StirRandom() (M)
- *
- * @param[in,out] esys_context The ESYS_CONTEXT.
- * @retval EXIT_FAILURE
- * @retval EXIT_SUCCESS
- */
- int
- test_esys_stir_random(ESYS_CONTEXT * esys_context)
- {
- TSS2_RC r;
- TPM2B_SENSITIVE_DATA inData = {
- .size = 20,
- .buffer = {1, 2, 3, 4, 5, 6, 7, 8, 9, 10,
- 11, 12, 13, 14, 15, 16, 17, 18, 19, 20}
- };
- r = Esys_StirRandom(
- esys_context,
- ESYS_TR_NONE,
- ESYS_TR_NONE,
- ESYS_TR_NONE,
- &inData);
- goto_if_error(r, "Error: StirRandom", error);
- return EXIT_SUCCESS;
- error:
- return EXIT_FAILURE;
- }
- int
- test_invoke_esys(ESYS_CONTEXT * esys_context) {
- return test_esys_stir_random(esys_context);
- }
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